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Digital Systems Testing and Testable Design

Abstract: How to test digital logic circuits, and design them to facilitate testability.

Keywords: book review, electronics, testing digital logic, design for testability, integrated circuits, construction.

Title: Digital Systems Testing and Testable Design
Author: Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Publisher: IEEE Press
Date Published: September 1994
ISBN: 0780310624
LOCN: TK7874.A23 1990b
Pages: 652

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This book is being considered for further review, but we do not yet have a copy in hand.

LIBRARY OF CONGRESS DATA

Author:        Abramovici, Miron.
Title:         Digital systems testing and testable design /
                  Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
Edition:       Rev. print.
Published:     New York : IEEE Press, [1994], c1990.
Description:   xviii, 652 p. : ill. ; 27 cm.
LC Call No.:   TK7874.A23 1990b
ISBN:          0780310624
Notes:         Includes bibliographical references and index.
Subjects:      Digital integrated circuits -- Testing.
               Digital integrated circuits -- Design and
                  construction.
Other authors: Breuer, Melvin A.
               Friedman, Arthur D.
Control No.:   94233953

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